Variable sample size control chart for monitoring process capability index Cpm Online publication date: Fri, 21-Aug-2020
by Dja Shin Wang; Hau Yu Yang; Tong Yuan Koo
International Journal of Industrial and Systems Engineering (IJISE), Vol. 36, No. 1, 2020
Abstract: Process capability indices (PCIs) provide numerical measures of process reproduction capability and are effective tools for quality assurance. In the present paper, we develop a variable sample size control chart, namely VSSCpm, to monitor PCIs for industry manufacturing to improve product quality. We setup the control limits; determine the upper and lower warning limits, fixed sample size, central region sample size, and warning region sample size for the control chart; and apply them to monitor PCI Cpm. We also use the average run length (ARL) as a monitoring performance indicator. To increase the in-plant applicability of the proposed method, we tabulate the performance value of the ARL for various commonly used situations. We perform a sensitivity analysis to study the effects of model parameters on the monitoring performance and then present an example to illustrate the proposed procedure.
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