Nanomanipulation and characterisation of individual nano-objects inside a SEM
by Denise Nakabayashi, Paulo C. Silva, Daniel Ugarte
International Journal of Nanotechnology (IJNT), Vol. 4, No. 5, 2007

Abstract: This paper describes the use of nanomanipulation for deforming, picking up and positioning nano-objects in situ in a field emission scanning electron microscope using an in-house built manipulator. Our experiments demonstrate that physical manipulation can be used in a wide range of different experiments and systems. The scope of possibilities is quite large, from mounting nanodevices to fabricating AFM tips based on CNTs in addition to measuring mechanical and electrical properties of individual nanosystems. Nanomanipulation has a large application potential in physics, chemistry, biology and engineering, rendering possible the idealised bottom-up approach to nanotechnology.

Online publication date: Mon, 06-Aug-2007

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Nanotechnology (IJNT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com