IDEF0 measurement planning model for a workpiece machined by a CNC lathe
by Zone-Ching Lin, Cong-Zhi Lin
International Journal of Computer Applications in Technology (IJCAT), Vol. 15, No. 1/2/3, 2002

Abstract: In the past, most research concerning coordinate measuring machines (CMM) concentrated on the automation of measuring process planning. However, a comprehensive analysis of the entire measuring operation should be conducted using a systematic method, before the application of any of the planning techniques. This systematic analysis should consider measuring planning and inspection operations at the same time to let measuring operations be incorporated into the entire manufacturing system. In this article, the workpiece machined by a CNC lathe is used to study the planning of the measuring process, and an IDEF0 planning model for measuring sequence and activities of the CMM is proposed. The measurement planner and the production system designer may then clearly understand the relationship among the different functions of the measuring system to enable the system integration problem to be solved more easily.

Online publication date: Tue, 15-Jul-2003

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Computer Applications in Technology (IJCAT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com