Determination of residual strain by combining EBSD and DIC techniques
by Jui-Chao Kuo, Han-Hong Wang
International Journal of Materials and Product Technology (IJMPT), Vol. 37, No. 3/4, 2010

Abstract: Electron Back-Scatter Diffraction (EBSD) can be applied to determine lattice defect and local strain distortion. The strain components were obtained with the help of the shifting of zone axis in Kikuchi patterns generated from EBSD. The displacement of zone axis in Kikuchi pattern was determined by using Digital Image Correlation (DIC) method, which provides a great resolution down to 0.01 pixels, which means the ideal sensitivity to be ∼3.6 × 10⁻⁵. However, the errors of calculating the residual strain can result from the image quality of Kikuchi patterns, such as the formation of dark areas in the Kikuchi patterns and the background noise.

Online publication date: Wed, 03-Feb-2010

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Materials and Product Technology (IJMPT):
Login with your Inderscience username and password:

Username:        Password:          Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com