Metric mapping: a new method to aid in the design of nanomanufacturing systems Online publication date: Sat, 28-Feb-2015
by Alexander H. Slocum,
International Journal of Nanomanufacturing (IJNM), Vol. 7, No. 2, 2011
Abstract: The creation of new systems for nanomanufacturing can be catalysed by a knowledge of manufacturing systems. A method for comparing macro-scale manufacturing metrics and nanoscale manufacturing processes allows a design engineer to objectively evaluate similarities between macro-scale and nano-scale processes. The result of mapping manufacturing metrics is that a design engineer will have a better understanding of which currently-available manufacturing technology can be easily modified to enable a given nano-scale process. Furthermore, a design engineer will be able to clearly identify areas where new technology must be developed in order to satisfy the performance requirements for a nanomanufacturing process not met by existing technology. A metric mapping method for comparing manufacturing process metrics to nanomanufacturing processes has been developed, which can be used to aid in the design of systems for manufacturing nano-scale products; metric mapping has been utilised to help create a machine for enabling high-throughput dip pen nanolithography.
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