Random pattern testability based on critical path tracing
by Che W. Chiou, Ted C. Yang
International Journal of Computer Applications in Technology (IJCAT), Vol. 3, No. 2, 1990

Abstract: A prediction or computation of the fault detection probabilities, FDPs, of all possible faults in a given electronic circuit is very important in the determination of whether the circuit is randomly testable. The two existing approaches for the determination of FDPs have their shortcomings. The first approach, using conventional predictive strategies, fails to approximate the real values and reveal the correct relations between the FDPs of faults. The second approach, using a fault simulator, is very costly in CPU time. In this paper, a new method based on critical path tracing is presented. By adding two counters, it can approximate correct FDPs and reveal the correct relations between faults. In addition, it adds only a little overhead in time. Examples and comparative results are also presented.

Online publication date: Wed, 11-Jun-2014

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Computer Applications in Technology (IJCAT):
Login with your Inderscience username and password:

Username:        Password:          Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com