Title: Fuzzy rule-based auto-tuned internal model controller for real-time experimentation on temperature and level processes

Authors: Ujjwal Manikya Nath; Chanchal Dey; Rajani K. Mudi

Addresses: Department of Instrumentation and Electronics Engineering, Jadavpur University, Salt Lake Campus, Kolkata, 700098, India ' Department of Applied Physics, Instrumentation and Control Engineering, University of Calcutta, 92 A.P.C. Road, Kolkata, 700009, India ' Department of Instrumentation and Electronics Engineering, Jadavpur University, Salt Lake Campus, Kolkata, 700098, India

Abstract: Recently, internal model control (IMC) technique has been widely employed for various industrial close-loop control applications. Rewarding feature of IMC controller is that we need to tune only one parameter λ (close-loop time constant) for achieving the desired close-loop response. But, finding an appropriate value of λ is not an easy task. From the basic behaviour of IMC-based close-loop responses, it is found that when the process variable is moving very fast towards the desired value, relatively larger value of λ (smooth control) is required to reduce the possible oscillations. In contrary, smaller value of λ (tight control) is preferred when the process response is quickly moving away from the set point to restrict its further deviation. Hence, to mitigate the limitation of conventional IMC tuning with a fixed λ, a fuzzy rule-based auto-tuning scheme is proposed here for IMC-proportional integral derivative (IMC-PID) controller and its performance is validated through real-time experimentation on temperature and level control loops.

Keywords: IMC-PID controller; fuzzy rule-based λ tuning; auto-tuning IMC; real-time application; temperature control loop; level control loop.

DOI: 10.1504/IJAAC.2020.105521

International Journal of Automation and Control, 2020 Vol.14 No.2, pp.239 - 256

Received: 25 Jan 2018
Accepted: 16 Aug 2018
Published online: 03 Mar 2020 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article