Title: Submicron centroid position measurement method of screw connected structure under temperature load

Authors: Xiao Chen; Muzheng Xiao; Zifu Wang; Zhijing Zhang; Xin Jin

Addresses: Beijing Institute of Technology, 5 South Zhongguancun Street, Haidian District, Beijing 100081, China ' Beijing Institute of Technology, 5 South Zhongguancun Street, Haidian District, Beijing 100081, China ' Beijing Institute of Technology, 5 South Zhongguancun Street, Haidian District, Beijing 100081, China ' Beijing Institute of Technology, 5 South Zhongguancun Street, Haidian District, Beijing 100081, China ' Beijing Institute of Technology, 5 South Zhongguancun Street, Haidian District, Beijing 100081, China

Abstract: This paper presents a submicron centroid position measurement method. Two laser displacement sensors are placed in the two ends of a screw connected structure for a real-time measurement. The entire measuring device is placed in a temperature controllable environment to measure the position change of the screw connected structure while temperature load is applied. The centroid position change of screw connected structure is calculated from the measured data. Uncertainty of the measurement method is analysed and a measurement experiment is carried out on the design structure. Under the action of a pre-tightening force about 400 N and a temperature change of 40°C, the maximum centroid position change of the structure is 7.46 μm. Finally, simulation based on surface form error of the measured structure is carried out to confirm that the measurement method proposed in this paper is effective.

Keywords: submicron; measurement method; screw connected structures; temperature load; screw pre-tightening force.

DOI: 10.1504/IJNM.2020.110381

International Journal of Nanomanufacturing, 2020 Vol.16 No.4, pp.287 - 298

Received: 06 Dec 2017
Accepted: 18 Jan 2019
Published online: 19 Oct 2020 *

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