Title: Hydrogen gas diffusion imaging using multiple FET type gas sensors
Authors: T. Kiwa, T. Yamaguchi, K. Tsubota, W. Naruyama, H. Yamada, K. Tsukada
Addresses: The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan. ' The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan. ' The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan. ' The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan. ' The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan. ' The Graduate School of Natural Science and Technology, Okayama University, 3-1-1, Tsushimanaka, Kitaku, Okayama, 700-8530, Japan
Abstract: Imaging of hydrogen gas concentrations were demonstrated using arrayed sensors system in the cylindrical diffusion tank-shaped simulator. The field effect transistor type hydrogen sensors with platinum gate electrode were used. The sensitivity of the sensors was around -34.1 mV/dec. and the response time was 1.2 sec. in average. By applying a sensor drive circuit to each sensor, the diffusion processes of the hydrogen gas were successfully obtained in time domain and two different processes were demonstrated using 100% hydrogen gas. These results indicate that real-time monitoring of the hydrogen gas distribution can be possible. Additionally, the calibration method of the acquired data was proposed.
Keywords: hydrogen gas sensors; sensor networks; gas distribution monitoring; gas diffusion imaging; sensor drive circuits; gas monitoring.
DOI: 10.1504/IJAMECHS.2010.033594
International Journal of Advanced Mechatronic Systems, 2010 Vol.2 No.4, pp.219 - 224
Published online: 07 Jun 2010 *
Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article