Title: Crack detection in dielectric structures by a linear sampling approach

Authors: G. Bozza, M. Brignone, M. Pastorino, M. Piana, A. Randazzo

Addresses: Department of Biophysical and Electronic Engineering, University of Genoa, via Opera Pia 11A, I-16145 Genoa, Italy. ' Department of Mathematics, University of Genoa, Via Dodecaneso 35, I-16146 Genoa, Italy; CNR-INFM LAMIA, Italy. ' Department of Biophysical and Electronic Engineering, University of Genoa, via Opera Pia 11A, I-16145 Genoa, Italy. ' Department of Computer Science, University of Verona, Ca' Vignal 2, Strada le Grazie 15, I-37134 Verona, Italy; CNR-INFM LAMIA, Italy. ' Department of Biophysical and Electronic Engineering, University of Genoa, via Opera Pia 11A, I-16145 Genoa, Italy

Abstract: In this paper, a new approach for the detection of cracks and defects inside dielectric structures is presented. The proposed algorithm is based on the Linear Sampling Method (LSM), which is a technique able to find the external shape of unknown objects starting from far-field measurements of the scattered electric field. In particular, in this contribution, the efficient No-Sampling LSM is modified to provide a reconstruction of the positions and shapes of defects located inside a known structure. This task is accomplished by inserting the Green|s function of the unperturbed object into the far-field equation. The effectiveness of the approach is assessed by means of numerical simulations.

Keywords: imaging systems; nondestructive testing; NDT; crack detection; linear sampling; inverse scattering; dielectric structures; cracks; defects; numerical simulation.

DOI: 10.1504/IJSISE.2010.034996

International Journal of Signal and Imaging Systems Engineering, 2010 Vol.3 No.2, pp.73 - 80

Received: 24 Mar 2009
Accepted: 26 Jun 2010
Published online: 31 Aug 2010 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article