Title: Metric mapping: a new method to aid in the design of nanomanufacturing systems

Authors: Alexander H. Slocum, Jr., Sourabh K. Saha, Martin L. Culpepper

Addresses: Department of Mechanical Engineering, Massachusetts Institute of Technology, 143 Albany St., Cambridge, Massachusetts 02139, USA. ' Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Bldg. 35-135, Cambridge, Massachusetts, 02139, USA. ' Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Bldg. 35-029, Cambridge, Massachusetts, 02139, USA

Abstract: The creation of new systems for nanomanufacturing can be catalysed by a knowledge of manufacturing systems. A method for comparing macro-scale manufacturing metrics and nanoscale manufacturing processes allows a design engineer to objectively evaluate similarities between macro-scale and nano-scale processes. The result of mapping manufacturing metrics is that a design engineer will have a better understanding of which currently-available manufacturing technology can be easily modified to enable a given nano-scale process. Furthermore, a design engineer will be able to clearly identify areas where new technology must be developed in order to satisfy the performance requirements for a nanomanufacturing process not met by existing technology. A metric mapping method for comparing manufacturing process metrics to nanomanufacturing processes has been developed, which can be used to aid in the design of systems for manufacturing nano-scale products; metric mapping has been utilised to help create a machine for enabling high-throughput dip pen nanolithography.

Keywords: nanomanufacturing processes; manufacturing metrics; metric mapping; METMAP; machine design; nanotechnology; dip pen nanolithography.

DOI: 10.1504/IJNM.2011.040720

International Journal of Nanomanufacturing, 2011 Vol.7 No.2, pp.143 - 157

Published online: 28 Feb 2015 *

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