Title: A fractal dimension-based method for statistical process control
Authors: Vijay Shah; David E. Booth
Addresses: Division of Business and Economics, West Virginia University, Parkersburg, WV 26104, USA ' Department of Management and Information Systems, Kent State University, Kent, OH 44242-001, USA
Abstract: For the development of computer-based statistical process control, it would be useful to have an algorithm that performs the work of a Shewhart control chart without actually having to construct such a chart. In this paper, we test the use of fractal dimension, an algorithm to track 'out of control' states and find it to be moderately successful.
Keywords: fractal dimension; outliers; statistical process control; SPC; control charts.
International Journal of Operational Research, 2012 Vol.14 No.2, pp.187 - 199
Published online: 11 Jan 2015 *
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