Title: Application of the standard porosimetry method for nanomaterials

Authors: Y.M. Volfkovich, A.V. Sakars, A.A. Volinsky

Addresses: Porotech Ltd., 100 Caster Avenue, Vaughan, L4L 5Y9 Ontario, Canada. ' Porotech Ltd., 100 Caster Avenue, Vaughan, L4L 5Y9 Ontario, Canada. ' Department of Mechanical Engineering, University of South Florida, 4202 E Fowler Ave ENB118, Tampa, FL 33620, USA

Abstract: A new method of Standard Porosimetry (MSP) for investigation of any type of porous materials, including soft, frail, amalgamated materials, films and powders has been developed. The method is relatively simple and non-destructive and can be used for measurements in a wide range of pore sizes from 0.3 nm to 3×10⁶ nm. The method is currently being used to study porous materials such as carbon nanotubes, membranes, thin films, ceramics, electrodes for batteries, paper etc., and can be used in other applications, including nanotechnology. The MSP employs numerous manual operations. In order to avoid them, the Automated Standard Porosimeter (ASP) has been developed based on the MSP by POROTECH, Ltd.

Keywords: porous structure; porosimetry; nanomaterials; capillary equilibrium; carbon nanotubes; automated porosimeter; porous size distribution; specific surface area; electrodes; non-destructive method; non-toxicity; non-amalgamation.

DOI: 10.1504/IJNT.2005.008066

International Journal of Nanotechnology, 2005 Vol.2 No.3, pp.292- 302

Published online: 11 Nov 2005 *

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