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Application of VR/AR technology for visualisation of radiation tolerance of VLSI
V.A. Shakhnov; V.V. Kazakov; A.A. Glushko; E.V. Rezchikova; B.S. Sorokin; T.A. Tsivinskaya; V.A. Verstov; L.A. Zinchenko
International Journal of Nanotechnology (IJNT), 2019 Vol.16 No.6/7/8/9/10, pp.569 - 575
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