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In-situ characterisation of the defect density in reduced graphene oxide under electrical stress using fluorescence microscopy
Zequn Zeng; Preetpal Singh; Sharon Lim Xiaodai; Cher Ming Tan; Chorng-Haur Sow
International Journal of Nanotechnology (IJNT), 2020 Vol.17 No.1, pp.57 - 70
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