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Deep learning-based feature extraction coupled with multi class SVM for COVID-19 detection in the IoT era
Mubarak Auwalu Saleh; Sertan Serte; Fadi Al-Turjman; R.A. Abdulkadir; Zubaida Sa'id Ameen; Mehmet Ozsoz
International Journal of Nanotechnology (IJNT), 2023 Vol.20 No.1/2/3/4, pp.7 - 24
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