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Multi-scale analysis of high precision surfaces by Stylus Profiler, Scanning White-Light Interferometry and Atomic Force Microscopy
N. Jouini, A. Gautier, P. Revel, P-E. Mazeran, M. Bigerelle
International Journal of Surface Science and Engineering (IJSURFSE), 2009 Vol.3 No.4, pp.310 - 327
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