Article Comments

Contributions from readers on our articles are very welcome. This form will let us retrieve the current data in the database and allows us to consider your comments.

Flaw growth monitoring as an aid to lifetime prediction
M.G. Silk, A.D. Whapham, C.P. Hobbs
International Journal of Materials and Product Technology (IJMPT), 1989 Vol.4 No.3, pp.215 - 231
12 - 9 =

Thank you for your feedback.

Return to top