Article Comments

ON/IOFF in ultradeep-submicron CMOS devices using grooved nMOSFETs for low-power applications">

Contributions from readers on our articles are very welcome. This form will let us retrieve the current data in the database and allows us to consider your comments.

Analysing ION/IOFF in ultradeep-submicron CMOS devices using grooved nMOSFETs for low-power applications
Subhra Dhar; Manisha Pattanaik; P. Rajaram
International Journal of Signal and Imaging Systems Engineering (IJSISE), 2013 Vol.6 No.1, pp.24 - 30
5 + 13 =

Thank you for your feedback.