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Characteristics of gate-all-around polycrystalline silicon channel SONOS flash memory
Joo Yun Seo; Sang-Ho Lee; Se Hwan Park; Wandong Kim; Do-Bin Kim; Byung-Gook Park
International Journal of Nanotechnology (IJNT), 2014 Vol.11 No.1/2/3/4, pp.116 - 125
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