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Punch-through and junction breakdown characteristics for uniaxial strained nano-node metal-oxide-semiconductor field-effect transistors on (100) wafers
Mu-Chun Wang; Heng-Sheng Huang; Min-Ru Peng; Shea-Jue Wang; Tsao-Yeh Chen; Wen-Shiang Liao; Hsin-Chia Yang; Chuan-Hsi Liu
International Journal of Materials and Product Technology (IJMPT), 2014 Vol.49 No.1, pp.25 - 40
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