Article Comments

Contributions from readers on our articles are very welcome. This form will let us retrieve the current data in the database and allows us to consider your comments.

Exploring failure mechanisms of near ultraviolet AlGaN/GaN light-emitting diodes by reverse-bias stress in water vapour
Hsiang Chen; Huan-Yu Shen; Shih-Chang Shei; Nai Chung Kang; Hung-Che Lai; Yu-Cheng Chu; Hung-Wei Chang
International Journal of Nanotechnology (IJNT), 2015 Vol.12 No.1/2, pp.38 - 45
9 + 4 =

Thank you for your feedback.

Return to top