Article Comments

Contributions from readers on our articles are very welcome. This form will let us retrieve the current data in the database and allows us to consider your comments.

In-situ infrared detection and heating of metallic phase of silicon during scratching test
Lei Dong, John A. Patten, Jimmie A. Miller
International Journal of Manufacturing Technology and Management (IJMTM), 2005 Vol.7 No.5/6, pp.530 - 539
9 + 6 =

Thank you for your feedback.

Return to top