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2VAl thin-films prepared by RF sputtering technique">

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Thickness dependence of thermal conductivity and electron transport properties of Fe2VAl thin-films prepared by RF sputtering technique
Satoshi Hiroi; Masashi Mikami; Koichi Kitahara; Tsunehiro Takeuchi
International Journal of Nanotechnology (IJNT), 2016 Vol.13 No.10/11/12, pp.881 - 890
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