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Accurate and rapid modelling of AFM tip morphology through scanning sphere nanoparticles
S. Yuan; X. Yao; F.J. Luan; J.G. Shi; Y.W. Qi; W. Gong
International Journal of Simulation and Process Modelling (IJSPM), 2017 Vol.12 No.3/4, pp.328 - 337
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