The microstructure of ultra-fine grade Ti (C, N)-based cermets Online publication date: Fri, 06-Oct-2006
by Ning Liu, Sheng Chao
International Journal of Machining and Machinability of Materials (IJMMM), Vol. 1, No. 2, 2006
Abstract: The microstructure of ultra-fine grade Ti (C,N)-based cermets was examined by X-Ray Diffractometry (XRD), Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM). A kind of new core/rim structure and an unknown compound based on Ni, Mo, W and C were detected and their formation mechanisms were discussed.
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