Embedded diagnosis based on vibration data
by Ouadie Bennouna, Houcine Chafouk, Olivier Robin, Jean-Philippe Roux
International Journal of Adaptive and Innovative Systems (IJAIS), Vol. 1, No. 3/4, 2010

Abstract: This article deals with a method based on vibration data measured on electronic systems to detect, identify and localise defects generated in these systems, in order to improve their reliability. The diagnosis procedure is based on the combination of wavelet transforms and neural networks; this procedure is applied to a simplified printed circuit board.

Online publication date: Mon, 23-Aug-2010

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