AFM-based imaging conditions optimisation of cell topography Online publication date: Wed, 18-Oct-2017
by Ya Li; Alamusi; Shen Dong; Jinghe Wang; Haidong Liu
International Journal of Nanomanufacturing (IJNM), Vol. 13, No. 4, 2017
Abstract: Surface topography of cancer cell is particularly vital since cell frequently changes its shape as interacting with neighbouring cells and extracellular matrix. Atomic force microscope (AFM) has an extraordinary superiority in surface scanning of cells but the scanning consequence depends upon experiment conditions or experience primarily. In our study, a quadratic regression orthogonal rotation combination design was operated to acquire optimal parameters for cell profiling via AFM. By iterative calculation, the optimum AFM scanning of cell can be accomplished at setpoint of 0.61 V, scanning rate of 2.23 Hz and proportional gain of 3.85. Satisfactory surface morphology images of human bronchial epithelium BEAS-2B and pulmonary adenocarcinoma cell A549 were acquired at this calculated scanning condition, in which the details of surface coarse particle and cell junction structure are visible. This emerging insight into cell profiling may encourage the understanding of the underlying mechanism for cellular inner reconstruction during cell migration.
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